From 7bfe8d4cf95fb32d2bb2e47c7696da0d22282baf Mon Sep 17 00:00:00 2001
From: Daniel Micay <daniel.micay@grapheneos.org>
Date: Thu, 13 Jun 2024 12:21:30 -0400
Subject: [PATCH] fix explanation of duress PIN test improvements

---
 static/releases.html | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/static/releases.html b/static/releases.html
index 9cfcec68..e0bec416 100644
--- a/static/releases.html
+++ b/static/releases.html
@@ -785,7 +785,7 @@
                         <li>add additional null check for eSIM wiping done as part of the duress PIN/password wipe implementation to avoid harmless exception</li>
                         <li>Settings: remove blank illustration from "Screen resolution" screen</li>
                         <li>Vanadium: update to <a href="https://github.com/GrapheneOS/Vanadium/releases/tag/126.0.6478.50.1">version 126.0.6478.50.1</a></li>
-                        <li>add additional duress PIN/password tests</li>
+                        <li>make duress PIN/password tests faster and more reliable</li>
                     </ul>
                 </article>
                 -->