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fix explanation of duress PIN test improvements

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Daniel Micay 2024-06-13 12:21:30 -04:00
parent f9b3910f91
commit 7bfe8d4cf9
1 changed files with 1 additions and 1 deletions
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@ -785,7 +785,7 @@
<li>add additional null check for eSIM wiping done as part of the duress PIN/password wipe implementation to avoid harmless exception</li>
<li>Settings: remove blank illustration from "Screen resolution" screen</li>
<li>Vanadium: update to <a href="https://github.com/GrapheneOS/Vanadium/releases/tag/126.0.6478.50.1">version 126.0.6478.50.1</a></li>
<li>add additional duress PIN/password tests</li>
<li>make duress PIN/password tests faster and more reliable</li>
</ul>
</article>
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